Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11237210 | Layout-aware test pattern generation and fault detection | Alodeep Sanyal, Girish A. Patankar, Rohit Kapur | 2022-02-01 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11237210 | Layout-aware test pattern generation and fault detection | Alodeep Sanyal, Girish A. Patankar, Rohit Kapur | 2022-02-01 |