Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11415549 | Eddy current flaw detection device | Hiroaki Arai, Akihiro Shin, Hiroshi Azuma | 2022-08-16 |
| 11318653 | Temperature control device, temperature control method, and non-transitory computer-readable storage medium | Takashi Sakaguchi | 2022-05-03 |
| 11320401 | Eddy current flaw detection device and eddy current flaw detection method | Hiroaki Arai, Akihiro Shin, Hiroshi Azuma | 2022-05-03 |