Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11538159 | Methods and apparatus for label compensation during specimen characterization | Stefan Kluckner, Yao-Jen Chang, Terrence Chen, Benjamin S. Pollack | 2022-12-27 |
| 11333553 | Methods and apparatus for specimen characterization using hyperspectral imaging | Benjamin S. Pollack | 2022-05-17 |