Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11391700 | Defect detection device | Yuya Nagata, Kenji Takubo | 2022-07-19 |
| 11226294 | Defect inspection apparatus | Kenji Takubo, Koki YOSHIDA | 2022-01-18 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11391700 | Defect detection device | Yuya Nagata, Kenji Takubo | 2022-07-19 |
| 11226294 | Defect inspection apparatus | Kenji Takubo, Koki YOSHIDA | 2022-01-18 |