Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11490498 | X-ray inspection apparatus and deterioration determination method for X-ray inspection apparatus | Bunta Matsuhana | 2022-11-01 |
| 11450502 | X-ray imaging apparatus and consumption level estimation method for X-ray source | Bunta Matsuhana | 2022-09-20 |