Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11257208 | Defect inspection system for specimen and defect inspection method for specimen | — | 2022-02-22 |
SH
Seong-Keun HA
Overall (2022): #267,914 of 548,613Top 50%
1
Patents 2022