Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11216622 | Test apparatus, test system including test apparatus, test method using test apparatus and test system, and method of manufacturing integrated circuit | Jae-Seol Lee, Hae Seong Jeong | 2022-01-04 |