Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11468353 | System for detecting data drift in machine-learning process monitoring | Francisco P. Maturana, Gregory J. Vance, Braun C. Brennecke | 2022-10-11 |
| 11287807 | Defect detection during an automated production process | Gregory J. Vance, Robert F. Trinnes, Francisco P. Maturana | 2022-03-29 |