Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11221423 | Processing apparatus, sysyem, X-ray measurement method, and program | Shintaro Kobayashi, Yasukazu Nakae, Yasutaka SAKUMA | 2022-01-11 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11221423 | Processing apparatus, sysyem, X-ray measurement method, and program | Shintaro Kobayashi, Yasukazu Nakae, Yasutaka SAKUMA | 2022-01-11 |