Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11514586 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +5 more | 2022-11-29 |
| 11477388 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +1 more | 2022-10-18 |
| 11399138 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel +1 more | 2022-07-26 |