Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11441896 | Inter-reflection detection apparatus and inter-reflection detection method | — | 2022-09-13 |
| 11321860 | Three-dimensional measurement apparatus, three-dimensional measurement method and non-transitory computer readable medium | Shinya Matsumoto | 2022-05-03 |
| 11302022 | Three-dimensional measurement system and three-dimensional measurement method | Takashi Shimizu, Shinya Matsumoto | 2022-04-12 |