Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11443415 | Inspection method, computer-readable recording medium, and reference standard plate | — | 2022-09-13 |
| 11226476 | Specimen observation apparatus | Tsuyoshi Mochizuki, Shintaro Takahashi, Akira Matsushita, Yohei TANIKAWA, Shinichi Takimoto | 2022-01-18 |