Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11448690 | Screening method and apparatus for detecting deep trench isolation and SOI defects | Laurent Segarra, Maarten Jacobus Swanenberg, Pierre Turpin, Matthew Bacchi, Keith Jackoski +1 more | 2022-09-20 |