Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11519960 | Circuit configured to determine a test voltage suitable for very low voltage (VLV) testing in an integrated circuit | Srikanth Jagannathan, Gayathri A. Bhagavatheeswaran | 2022-12-06 |
| 11489535 | Analog-to-digital converter (ADC) testing | Xiankun Jin, Douglas A. Garrity, Mark Lehmann | 2022-11-01 |