Issued Patents 2022
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11430647 | Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry | David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt | 2022-08-30 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11430647 | Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry | David A. Reed, Bruno W. Schueler, Bruce H. Newcome, Rodney Smedt | 2022-08-30 |