Issued Patents 2022
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11518034 | Malfunction determination method and malfunction determination device | Yasuhiro Tanaka, Toshimichi Urakawa, Minoru Tomikashi | 2022-12-06 |
| 11433539 | Abnormality determination device and abnormality determination method | Seiichi Kobayashi | 2022-09-06 |
| 11370131 | Abnormality detecting device and abnormality detecting method | Satoru Hirose | 2022-06-28 |
| 11268900 | Polarization property image measurement device, and polarization property image measurement method | Takanori KOJIMA, Satoru Odate | 2022-03-08 |