Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11316770 | Abnormality detection apparatus, abnormality detection method, and abnormality detection program | Naoto Fujiki, Tomoyasu Sato, Takeshi Nakatsuru, Takuya MINAMI | 2022-04-26 |