Issued Patents 2022
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11530908 | Measurement point determination method, non-transitory storage medium, and measurement point determination apparatus | Takeshi Hagino, Yuto Inoue | 2022-12-20 |
| 11525664 | Calibration method | — | 2022-12-13 |
| 11366447 | Spatial accuracy correction method and apparatus | Shinichiro Yanaka | 2022-06-21 |
| 11366448 | Spatial accuracy correction method and apparatus | Shinichiro Yanaka | 2022-06-21 |
| 11359910 | Inspection method, correction method, and inspection device | — | 2022-06-14 |