Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11465507 | Abnormality monitoring device, abnormality monitoring method, and program | Akihisa Kawauchi, Koji Uchida, Katsuya Kuroki, So TAMURA | 2022-10-11 |
| 11359911 | Abrasion inspection apparatus, abrasion inspection method, and program | Katsuaki Morita, Masahiro Yamada, Kazuki Ozaki | 2022-06-14 |
| 11280624 | Control device, control system, movable object, control method, and program | Satoshi Iwasaki, Koji Uchida | 2022-03-22 |