Issued Patents 2022
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11500017 | Testing memory elements using an internal testing interface | Albert Shih-Huai Lin | 2022-11-15 |
| 11429481 | Restoring memory data integrity | Sarosh I. Azad, Wern-Yan Koe | 2022-08-30 |
| 11302589 | Electron beam probing techniques and related structures | Radhakrishna Kotti, Mallesh Rajashekharaiah | 2022-04-12 |
| 11290095 | Programmable dynamic clock stretch for at-speed debugging of integrated circuits | Niravkumar Patel | 2022-03-29 |
| 11263377 | Circuit architecture for expanded design for testability functionality | Albert Shih-Huai Lin, Partho Tapan Chaudhuri, Niravkumar Patel | 2022-03-01 |
| 11222695 | Socket design for a memory device | Radhakrishna Kotti, Rajasekhar Venigalla | 2022-01-11 |