Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11255791 | Method of and apparatus for spatially measuring nano-scale structures | Stefan W. Hell, Yvan Eilers, Klaus Gwosch | 2022-02-22 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11255791 | Method of and apparatus for spatially measuring nano-scale structures | Stefan W. Hell, Yvan Eilers, Klaus Gwosch | 2022-02-22 |