Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11215444 | Apparatus and method for measurement of multilayer structures | Michael A. Marcus, Kyle J. Hadcock, Filipp V. Ignatovich | 2022-01-04 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11215444 | Apparatus and method for measurement of multilayer structures | Michael A. Marcus, Kyle J. Hadcock, Filipp V. Ignatovich | 2022-01-04 |