Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11486693 | Measurement apparatus and measurement method | Teruaki Yamazaki, Hideo Takizawa | 2022-11-01 |
| 11372222 | Confocal microscope and method for taking image using the same | — | 2022-06-28 |