Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11366398 | Time-domain optical metrology and inspection of semiconductor devices | Gilad Barak, Michael Chemama, Smadar Ferber, Yanir Hainick, Ze'ev Lindenfeld +3 more | 2022-06-21 |
| 11321028 | Correcting registration errors in digital printing | — | 2022-05-03 |