Issued Patents 2022
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11460502 | Processor-based measuring method for testing device under test, and measuring device using same | Byeong-Yun Kim | 2022-10-04 |
| 11320483 | Method for testing device under test and apparatus using the same | Byeong-Yun Kim | 2022-05-03 |
| 11295936 | Apparatus and method for treating substrate | Dukhyun Son | 2022-04-05 |
| 11255886 | Current measurement apparatus including charge/discharge means and current measurement method using same | Byeong-Yun Kim | 2022-02-22 |