Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11237872 | Semiconductor inspection and metrology systems for distributing job among the CPUs or GPUs based on logical image processing boundaries | Ajay Gupta, Sankar Venkataraman, Mohan Mahadevan | 2022-02-01 |