Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11275361 | Systems and methods for predicting defects and critical dimension using deep learning in the semiconductor manufacturing process | — | 2022-03-15 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11275361 | Systems and methods for predicting defects and critical dimension using deep learning in the semiconductor manufacturing process | — | 2022-03-15 |