Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11378477 | Apparatus for measuring surface profile of normal and shear stress | Mykhailo Pevnyi, Fred Minkowski, Vincent Hetherington, Hiroshi Yokoyama, Peter Palffy-Muhoray | 2022-07-05 |