Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11486831 | Specimen measurement device and control method of specimen measurement device | Ichiro Tono, Takeshi Yamauchi | 2022-11-01 |
| 11467086 | Sample inspection apparatus | Isao Nawata, Takeshi Yamauchi | 2022-10-11 |