Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11410300 | Defect inspection device, defect inspection method, and storage medium | Kyoka Sugiura, Yukinobu Sakata, Akiyuki Tanizawa | 2022-08-09 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11410300 | Defect inspection device, defect inspection method, and storage medium | Kyoka Sugiura, Yukinobu Sakata, Akiyuki Tanizawa | 2022-08-09 |