Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11536743 | Kelvin contact for inspection, kelvin socket for inspection, and method of manufacturing kelvin contact for inspection | Akira Genma, Tsuyoshi Matsumoto, Tetsuya Kubota | 2022-12-27 |
| 11531060 | Cylindrical member, contact probe and semiconductor inspection socket | Takeyuki Suzuki, Satoshi Iizumi | 2022-12-20 |
| 11360118 | Contact probe and inspecting socket including the same | Seiya Yamamoto | 2022-06-14 |