Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11333700 | Inspection apparatus of semiconductor device and method for inspecting semiconductor device | Jumpei Tajima, Shinya Nunoue | 2022-05-17 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11333700 | Inspection apparatus of semiconductor device and method for inspecting semiconductor device | Jumpei Tajima, Shinya Nunoue | 2022-05-17 |