Issued Patents 2022
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11536652 | Optical test apparatus and optical test method | Hiroya KANO, Hideaki Okano | 2022-12-27 |
| 11534968 | Nozzle and additive manufacturing apparatus | Satoshi Tsuno, Mitsuo Sasaki, Tomohiko Yamada, Yasutomo SHIOMI, Shimpei Fujimaki | 2022-12-27 |
| 11509119 | Wavelength beam combining system and method for manufacturing laser diode bar array | — | 2022-11-22 |
| 11474074 | Detection apparatus, convergence member, and noise cancellation system | Takashi Usui | 2022-10-18 |
| 11437773 | Wavelength conversion device | Naoya Ryoki, Kentaro Miyano, Akihiko Ishibashi, Masaki Nobuoka | 2022-09-06 |
| 11415510 | Optical inspection apparatus | Hiroya KANO, Hideaki Okano, Takahiro Kamikawa | 2022-08-16 |
| 11386570 | Measurement method and measurement apparatus | Kiminori Toya | 2022-07-12 |
| 11333492 | Optical device, information processing method, and computer program product | Hiroya KANO, Hideaki Okano | 2022-05-17 |
| 11297308 | Optical test apparatus and optical test method | Hiroya KANO | 2022-04-05 |
| 11249028 | Apparatus for inspecting object surface | Takahiro Kamikawa, Takehiro Hato | 2022-02-15 |