Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11403747 | Fine ratio measuring device and fine ratio measuring system | Naoshi Yamahira, Takahiro Nishino, Takehide Hirata, Toshiki Tsuboi | 2022-08-02 |
| 11391662 | Raw material particle size distribution measuring apparatus, particle size distribution measuring method, and porosity measuring apparatus | Naoshi Yamahira, Takahiro Nishino, Takehide Hirata, Toshiki Tsuboi | 2022-07-19 |