Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11486822 | Specimen inspection device and specimen inspection method | Hak-Sung Kim, Dong Woon PARK | 2022-11-01 |
| 11346659 | Device for measuring thickness of specimen and method for measuring thickness of specimen | Hak-Sung Kim, Dong Woon PARK | 2022-05-31 |