Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11456148 | Aberration reduction in multipass electron microscopy | Mark A. Kasevich, Stewart A. Koppell, Brannon Klopfer, Thomas Juffmann | 2022-09-27 |
| 11340293 | Methods for performing a non-contact electrical measurement on a cell, chip, wafer, die, or logic block | Indranil De, Dennis Ciplickas, Christopher Hess, Jeremy Cheng, Balasubramanian Murugan +1 more | 2022-05-24 |
| 11276549 | Compact arrangement for aberration correction of electron lenses | — | 2022-03-15 |