Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11215663 | Systems and methods for parametric testing | James R. Reedholm, John M. Fluke, Jr., Simon M. Black | 2022-01-04 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11215663 | Systems and methods for parametric testing | James R. Reedholm, John M. Fluke, Jr., Simon M. Black | 2022-01-04 |