Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11415617 | Field-biased second harmonic generation metrology | Marc Kryger, John Changala | 2022-08-16 |
| 11293965 | Wafer metrology technologies | Marc Kryger, John Changala | 2022-04-05 |