Issued Patents 2022
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11512943 | Optical system and method for measuring parameters of patterned structures in micro-electronic devices | Danny Grossman, Moshe Vanhotsker, Guy ENGEL, Elad Dotan | 2022-11-29 |
| 11460415 | Optical phase measurement system and method | Gilad Barak, Dror Shafir, Yanir Hainick | 2022-10-04 |