Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11486689 | Metrology system | Derek Aqui, Mark Baker, Chris Barns, Robert Batten, Jared Greco +2 more | 2022-11-01 |
| 11450145 | System and method for monitoring procedure compliance | John David Worrall, Ronald Dearing, Gregory Brooks Hale, Scott William Rench | 2022-09-20 |