Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11379649 | Advanced cell-aware fault model for yield analysis and physical failure analysis | Brian Archer | 2022-07-05 |
| 11334698 | Cell-aware defect characterization by considering inter-cell timing | Emil Gizdarski, Xiaolei Cai | 2022-05-17 |