Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11473903 | Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopy | Jeffrey H. Hunt, Jianing Shi | 2022-10-18 |
| 11415617 | Field-biased second harmonic generation metrology | Viktor Koldiaev, Marc Kryger | 2022-08-16 |
| 11293965 | Wafer metrology technologies | Viktor Koldiaev, Marc Kryger | 2022-04-05 |