Issued Patents 2022
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11315654 | Memory testing techniques | Andy Wangkun Chen, Yannis Jallamion-Grive, Cyrille Dray | 2022-04-26 |
| 11280832 | Memory embedded full scan for latent defects | Andy Wangkun Chen, Richard Slobodnik | 2022-03-22 |