Issued Patents 2022
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11514586 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Mark Uebel, Alan Philip Franks +5 more | 2022-11-29 |
| 11477388 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Mark Uebel, Alan Philip Franks +1 more | 2022-10-18 |
| 11455333 | Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions | Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Mark Uebel, Alan Philip Franks +2 more | 2022-09-27 |
| 11399138 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, John Damiano, Jr., David P. Nackashi, Mark Uebel, Alan Philip Franks +1 more | 2022-07-26 |
| 11222765 | Electron microscope sample holder fluid handling with independent pressure and flow control | Franklin Stampley Walden, II, John Damiano, Jr., William Bradford Carpenter | 2022-01-11 |