Issued Patents 2022
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11429806 | Devices, systems, and methods for anomaly detection | Xiwu Cao | 2022-08-30 |
| 11332781 | Fitting melting curve data to determine copy number variation | Yang Yang, Sophie Paquerault, Lingxia Jiang | 2022-05-17 |
| 11321846 | Devices, systems, and methods for topological normalization for anomaly detection | Xiwu Cao | 2022-05-03 |
| 11308589 | Devices, systems, and methods for enhancing images | Yunzhe Zhao | 2022-04-19 |
| 11232851 | System and method for modeling and subtracting background signals from a melt curve | Yang Yang, Sophie Paquerault, Lance Charlton, Jeanette Paek, Attaullah Seikh +4 more | 2022-01-25 |
| 11216940 | Metrology-based assisted defect recognition | Yunzhe Zhao | 2022-01-04 |