Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11237105 | System for measuring the absorption of a laser emission by a sample | — | 2022-02-01 |
| 11215637 | Method and apparatus of atomic force microscope based infrared spectroscopy with controlled probing depth | Anirban Roy, Honghua Yang | 2022-01-04 |