Issued Patents 2022
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11430118 | Methods and systems for process control based on X-ray inspection | Scott Joseph Jewler | 2022-08-30 |
| 11373778 | Devices processed using x-rays | — | 2022-06-28 |
| 11307152 | X-ray photoemission apparatus for inspection of integrated devices | — | 2022-04-19 |