Issued Patents 2022
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11513149 | Method for evaluating electrical defect density of semiconductor layer, and semiconductor element | Kuniyuki Kakushima, Takuya Hoshii, Hitoshi Wakabayashi, Hiroshi Iwai, Taiki YAMAMOTO | 2022-11-29 |