Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11276155 | Automated inspection system and automated inspection method including a data collection device that generates exposure parameter determination information | Jumpei Honda, Takuma NISHIMURA | 2022-03-15 |
| 11238673 | Automatic inspection system and method for controlling automatic inspection system | Jumpei Honda, Takuma NISHIMURA, Hidemasa NAKAI, Yuichi Igarashi, Ryo Nakano | 2022-02-01 |