Issued Patents 2022
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11486917 | Electromagnetic wave measurement point calculation device and radiation interference wave measurement device | Masataka MIDORI, Tomohiro Honya | 2022-11-01 |
| 11465255 | Lapping material and method for producing the same, and method for producing polished product | Shin Tokushige, Keisuke Nakase, Hiroshi Kashiwada, Kenichi Koike | 2022-10-11 |